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  • SEMs Provide Deep Insight Into Materials

    Wednesday, February 10, 2016
    Application Note
    Donna Guarrera
    Modern scanning electron microscopes (SEMs) offer vast improvements over early models in terms of electron optics, detector design and computing technology. read more
  • Automated Sample Preparation Using a Dual-Arm Robotic Platform

    Monday, May 02, 2016
    Application Note
    Heidi Fleischer Kerstin Thurow Thomas Roddelkopf Xianghua Chu Norbert Stoll Michael Klos
    As described in this article, the CSDA10F dual-arm robot can utilize pipets, syringes, vials, microplates and thermal shakers (including pipets and a thermal shaker designed for manual use) to prepare... read more
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